Curve Tracing Capability. • Six Separate V/I Supplies. • Latch-Up Testing with 64k /pin. ESD and Latch-up Test Services. MM (30V – 2kV). • EIA/JESDAC. JESDA is a reference document; it is not a requirement per JESD47 ( Stress Test Driven Qualification of Integrated Circuits). Machine. AEDR and AEDR Reflective Surface Mount Optical Encoder Reliability Data Sheet Description Failure Rate Prediction The following.

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Discharges to devices on unterminated circuit assemblies are also well-modeled by the CDM test.

Section 2 “ESD (Electrostatic Discharge) testing”

Results of such calculations are shown in the table below using an activation energy of 0. Multiple Chip A1115 JC CDM ESD events not only reduce assembly yields but can also produce w115 damage that goes undetected by factory test and later is the cause of a latent failure.

In June the formulating committee approved the addition of the ESDA logo on the covers of this document. Part I will primarily address hard failures characterized by physical damage to a system failure category d as classified by IEC AVEN – April 27, Solid State Memories JC This confidence interval is based on the statistics of the distribution of failures.

One of many examples is a device sliding down a shipping tube hitting a metal surface. In this regard, the document’s purpose is to provide the necessary technical arguments for strongly recommending no further use of this model for IC qualification.

ELECTROSTATIC DISCHARGE (ESD) SENSITIVITY TESTING MACHINE MODEL (MM) | JEDEC

Avago tests parts at the absolute maximum rated conditions recommended for the device. Over the last several decades the so called “machine model” aka MM and its application to the required ESD component qualification has been grossly misunderstood. Quality and Reliability of Solid State Products filter.

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The relationship between ambient given by the following: The actual performance you obtain from Avago parts depends on the electrical and environmental characteristics of your application but will probably be better than the performance outlined in Q115 1.

This new test method describes a uniform method for establishing charged-device model electrostatic discharge withstand thresholds. The purpose objective of this standard is to establish a test method that will replicate HBM jes22 and provide reliable, repeatable HBM ESD test results from tester to tester, regardless of component type.

The assumed distribution of failures is exponential. This particular distribution is commonly used in describing useful life failures. Displaying 1 – 7 of 7 documents.

Show 5 results per page. Catastrophic failures are open, short, no logic output, no dynamic parameters while parametric failures are failures to meet an electrical characteristic as specified in product catalog such as output voltage, duty or state errors.

Failures are catastrophic or parametric.

Please see Annex C for revision history. This document was written with the intent to provide information for quality organizations in both semiconductor companies and their customers to assess and make decisions on safe ESD CDM level requirements.

Data subject to change.

The document jesc22 organized in different sections to give as many technical details as possible to support the purpose given in the abstract. Registration or login required. This document was written with the intent to provide information for quality organizations in both semiconductor companies and their customers to assess and make decisions on safe ESD level requirements. This report is the first part of a two part document.

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Standards & Documents Search | JEDEC

Filter by document type: This standard establishes the procedure for jesf22, evaluating, and classifying components and microcircuits according to their susceptibility sensitivity to damage or degradation by exposure to a defined human body model HBM electrostatic discharge ESD. Search by Keyword or Document Number. It will be shown through this document why realistic modifying of the ESD target jesd222 for component level ESD is not only essential but is also urgent.

Reaffirmed May JEP Oct This document was written with the intent to provide information for quality organizations in both semiconductor companies and their customers to assess and make decisions on safe ESD CDM level requirements.

Standards & Documents Search

The failure rate of semiconductor devices is determined by the junction temperature of the device. The scope of this JEDEC document is to present evidence to discontinue use of this particular model stress test without incurring any reduction in the IC component’s ESD reliability for manufacturing.

In the case of zero failures, one failure is assumed for this calculation. The published document should be used as mesd22 reference to propagate this message throughout the industry.